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IWSSS 2017 : 5th International Workshop on Systems Safety and Security | |||||||||||||||
Link: http://iwsss.org | |||||||||||||||
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Call For Papers | |||||||||||||||
IWSSS 2017 is the 5th edition of International Workshop on Systems Safety & Security, an interdisciplinary workshop that concentrates valuable knowledge from various fields of automatic control, computers and electronics. Special interest topics of the workshop are preventing, detecting and responding cyber-attacks and malware in control systems and networks by using modern approaches.
Our intention is to bring together practitioners and implementers from industry, prestigious researches from academia and young scientists and specialists. Our aim is to create an event to promote scientific research in this challenging field of systems safety and security and to let academia and industry make a strong partnership in order to develop new products and technologies. Workshop topics: - Systems security & safety - Malware detection, modelling and analysis methods in control systems - Data security and privacy in critical systems - Real time monitoring of critical infrastructures - Physical and logical access control - Biometric identification of persons - Systems security & safety with applications in automotive industry - Intelligent sensors applied in safety and security solutions - Wireless sensor networks security - Signal processing and data acquisition - Artificial intelligence used in the field of safety and security - Automotive tracking, monitoring and surveillance solutions IWSSS 2017 is organized in conjunction with the 9th Electronics, Computers & Artificial Intelligence International Conference - ECAI 2017. All the papers accepted at previous editions of IWSSS were published in IEEE Xplore and the papers from the first 3 editions (2013 - 2015) are indexed in Thomson Reuters Web of Science (ISI). The papers from IWSSS 2016 are pending indexing in ISI. All accepted papers will be included in ECAI conference proceedings which will be published in IEEE Xplore database. |
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