The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of nanoelectronic circuits and systems.The symposium also offers an insight into relevant European R&D collaborative programs, projects, and technology platforms.

The DDECS Symposium series has been organised by Central European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), and Austria (2010).

DDECS 2011 is organised by Brandenburg University of Technology Cottbus and the Leibniz Institute IHP - "Innovations for High-Performance Microelectronics" in Frankfurt (Oder), Germany. The symposium is sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC).

Topics of interest include but are not limited to:

- ASIC and SoC Design
- FPGA Design
- Bio-inspired Hardware
- Design Verification/Validation
- Formal Methods in System Design
- Hardware/Software Co-Design
- IP-based Design
- Logic Synthesis
- Physical Design
- Design and Test in Nano-Technologies
- Reconfigurable Computing
- Network-based Collaborative Design
- Analog, Mixed-Signal, and RF Test
- SoC Test
- Built-in Self-Test and Self-Repair
- Design for Testability and Diagnosis
- Defect/Fault Tolerance and Reliability
- On-line Testing
- Embedded Systems Testing
- Memory, Processor Testing
- MEMS Testing
- ATE Hardware and Software
- Dependable HW / SW Systems