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QRS 2019 : The 19th IEEE International Conference on Software Quality, Reliability, and Security

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Link: http://qrs.techconf.org/
 
When Jul 22, 2019 - Jul 26, 2019
Where Sofia, Bulgaria
Abstract Registration Due Mar 8, 2019
Submission Deadline Mar 15, 2019
Notification Due May 25, 2019
Final Version Due Jun 10, 2019
Categories    software quality   software reliability   software security   software testing
 

Call For Papers

Call for Papers

QRS 2019
The 19th IEEE International Conference on
Software Quality, Reliability & Security

http://qrs.techconf.org/
July 22 - 26, 2019
Sofia, Bulgaria


The 19th IEEE International Conference on Software Quality,
Reliability, and Security (QRS 2019) will be held from
July 22 to 26 in Sofia, Bulgaria.

Please visit http://qrs.techconf.org/ for more details.`

The conference consists of many components including

(1) Research Track (regular and short papers)
(2) Industry Track
(3) Fast Abstract Track
(4) Poster Sessions
(5) Tutorials
(6) Workshops
(7) Panels
(8) Keynote Speeches

We cordially invite you to submit papers to QRS 2019.
Please refer to the following for more details.

Rui Kang (General Chair; Beihang University, China)
Bruce McMillin (Program Chair; Missouri University of Science and Technology, USA)
David Lo (Program Chair; Singapore Management University, Singapore)

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International Software Testing Contest
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The 3rd IEEE International Software Testing Contest will also
be held in conjunction with QRS 2019 on July 23.

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Conference Proceedings
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The proceedings will be published by IEEE Computer Society
Conference Publishing Services (CPS). Accepted papers will
also be submitted for inclusion into the IEEE Xplore and
to other abstracting and indexing partners such as
the Ei Compendex.

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Important Dates
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Workshop Proposals: January 15, 2019
Abstracts (Regular & Short): March 8, 2019
Regular & Short Papers: March 15, 2019
Workshop Papers: May 1, 2019
Fast Abstract: May 1, 2019
Industry Track: May 1, 2019
Author Notification: May 25, 2019
Camera-ready & author registration: June 10, 2019

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SOCIAL MEDIA
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Twitter: @QRS_conference
Facebook: fb.me/QRSconference

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TOPICS OF INTEREST
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Topics of interest include, but are not limited to the
following subjects:

* Reliability, security, availability, and safety of software systems
* Software testing, verification, and validation
* Program debugging and comprehension
* Information and software quality assurance
* Fault tolerance for software reliability improvement
* Modeling, prediction, simulation, and evaluation
* Metrics, measurements, and analysis
* Secure and reliable storage
* Software penetration and protection
* Software vulnerabilities
* Formal methods
* Malware detection and analysis
* Intrusion detection and prevention
* Operating system security and reliability
* Mobile and smartphone applications
* Internet of things and cloud computing
* Information and knowledge management
* Benchmark, tools, industrial applications, and empirical studies

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SUBMISSION
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Submit original manuscripts (not published or considered elsewhere)
with the following page maximums: twelve pages (regular papers),
eight pages (short papers and workshop papers), and two pages
(Fast Abstract Track and Industry Track). Each paper should include a
title and the name and affiliation of each author. Except for the
Fast Abstract Track and Industry Track, each submission should also
include a 150-word abstract and up to 6 keywords. The format of your
submission must follow the guidelines for IEEE conference proceedings
(http://www.ieee.org/conferences_events/conferences/publishing/templates.html).
At least one Best Paper Award with a cash prize will be presented.
Detailed instructions for paper submission can be found
at http://qrs.techconf.org.

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GENERAL INQUIRIES
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For more detailed and updated information, please refer to
http://qrs.techconf.org, or contact Steering Committee Chair,
Professor W. Eric Wong, at ewong@utdallas.edu, for general questions or
Program Chairs, Professor Bruce McMillin at ff@mst.edu and Professor
David Lo at davidlo@smu.edu.sg for paper submission and review.

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