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IOLTS 2009 : IEEE International On-Line Testing Symposium


Conference Series : International On-Line Testing Symposium
When Jun 24, 2009 - Jun 27, 2009
Where Sesimbra-Lisbon, Portugal
Submission Deadline Feb 2, 2009
Notification Due Mar 27, 2009
Final Version Due Apr 15, 2009
Categories    testing   computer architecture   fault tolerant systems

Call For Papers

15th IEEE International On-Line Testing Symposium
Sesimbra-Lisbon, Portugal, June 24–27, 2009
Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has
led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand
for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer
technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line
testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for
presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large
applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Computer
Society Test Technology Technical Council and organized by TIMA Laboratory, INESC-ID, and University of Piraeus.
The topics of interest include (but are not limited to) the following ones:
. Reliability issues in nanometer technologies
. Design for reliability
. Design for variability
. On-line testing of analog and mixed signal circuits
. On-line testing in the continuous operation of large systems
. On-line testing in automotive, railway, avionics, industry
. On-line current, temperature, etc, monitoring
. On-line and off-line built-in self-test
. Self-checking circuits and coding theory
. Dependability aware power and performance management
. Dependability evaluation
. Dependable systems design
. Field diagnosis, maintainability and reconfiguration
. Synthesis of on-line testable circuits
. Fault-tolerant and fail-safe systems
. On-line power monitoring and control
. Radiation effects
. Secure circuit design
. Fault-based attacks and counter measures
Submissions: The IOLTS Program Committee invites authors to submit papers in the above or related technical areas. Accepted papers will be
included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the
symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, papers should be allowed six pages in the
IEEE Proceedings of the Symposium.
Please observe the following key dates:
Submission deadline: February 2 2009 – Notification of acceptance: March 27 2009 – Camera-ready papers due: April 15 2009
Submission Information General Information
Dimitris Gizopoulos Abhijit Chatterjee Michael Nicolaidis Marcelino Bicho dos Santos
University of Piraeus Georgia Tech TIMA Laboratory INESC-ID (IST / UTL)
Department of Informatics School of ECE Grenoble, France Lisbon, Portugal
Piraeus, Greece Atlanta, Georgia, USA Tel: +33 (0) 4 76 57 46 96 Tel: +351 213100288
Tel: +30 210 414 2372 Tel: +1 404.894.1880
About the Venue: IOLTS 2009 will be held in Sesimbra Hotel & SPA, one of the Finest Resorts of the area (
The hotel is located in a long beach with warm and calm waters 30km south of Lisbon. Portugal’s capital is famous for its monuments, museums
and rich cultural life. Although it boasts a range of must-see sights, its biggest pleasures are its streetlife and setting, admired from a pavement cafe
or simply by wandering around the atmospheric old quarters.
For all updated information concerning IOLTS 2009, please visit the IOLTS web site:
General Chairs Audio Visual P. Girard, LIRMM P. Prinetto, Politec. di Torino
M. Nicolaidis, TIMA Laboratory J. Rocha, ISEL M. Goessel, U. Postdam H. Puchner, Cypress
M. Santos, IST/UTL, INESC-ID E. Simeu, TIMA Laboratory A. Haggag, Freescale D. Radaelli, Cypress
Program Chairs J. Hayes, U. Michigan M. Rebaudengo, Politec. di Torino
ETTTC Liaison
D. Gizopoulos, U. Piraeus Z. Peng, Linköping U.
T. Heijmen, NXP K. Roy, Purdue U.
S. Hellebrand, U. Paderborn P. Sanda, IBM
A. Chatterjee, Georgia Tech. Program Committee E. Ibe, Hitachi J. Segura, U. Illes Balears
Vice-General Chairs J. Abraham, U. Texas at Austin A. Ivanov, U. Brit. Columbia N. Seifert, Intel
A. Paschalis, U. Athens D. Alexandrescu, iRoC R. Iyer, U. Illinois C. Slayman, Sun
Y. Zorian, Virage Logic D. Appello, ST Microelectronics A. Krasniewski, Warsaw U. T. M. Sonza Reorda, Politec. di Torino
S. Kundu, U. Mass. Amherst J. Sosnowski, Warsaw U. T.
Vice-Program Chairs M. Baklashov, ARM
R. Galivanche, Intel L. Batina, K. U. Leuven R. Leveugle, TIMA L. Sourgen, ST Microelectronics
A. Majumdar, AMD/ATI H. Stratigopoulos, TIMA
S.-J. Wen, Cisco R. Baumann, TI
M. Benabdenbi, LIP6 C. Metra, U. Bologna M. Tehranipoor, U. Connecticut
Special Sessions S. Bhabu, Cadence S. Mitra, Stanford U. J. P. Teixeira, IST/INESC-ID
R. Aitken, ARM N. Bidokhti, Cisco F. Monteiro, U. Metz Y. Tosaka, Fujitsu Labs
Local Arrangements E. Boehl, Robert Bosch GmbH S. Mukherjee, Intel N. Touba, U. Texas
C. Almeida, IST/UTL, INESC-ID C. Bolchini, Politec. di Milano S. Mukhopadhyaya, Georgia Tech. S. Tragoudas, U. Southern Illinois
A. Bougerol, EADS D. Nikolos, U. Patras T. Uemura, Fujitsu Labs
Publications A. Bystrov, U. Newcastle P. Pande, Washington State U. F. Vargas, PUCRS
M. Psarakis, U. Piraeus N. Buard, EADS C. Papachristou, CWRU R. Velazco, TIMA
N. Zergainoh, TIMA Laboratory Y. Cao, Arizona State U. A. Papanikolaou, NTUA X. Vera, Intel Labs Barcelona
Publicity S. Chakravarty, LSI Logic R. Parekhji, TI M. Violante, Politec. di Torino
I. Parulkar, Sun I. Voyiatzis, TEI Athens
L. Anghel, TIMA Laboratory V. Chandra, ARM
B. Paul, Toshiba L.-C. Wang, UC Santa Barbara
Y. Makris, Yale U. J. Collet, LAAS
M. Dabreu, Sandisc M. Pflanz, IBM Germany A. Wood, Sun
Finance R. Drechsler, U. Bremen S. Piestrak, U. Metz H. J. Wunderlich, U. Stuttgart
J. Semião, U. Algarve, INESC-ID P. Fouillat, IXL-ENSEIRB M. Pignol, CNES Q. Xu, Chinese U. Hong Kong
G. Georgakos, Infineon I. Polian, U. Freiburg M. Zhang, Intel
G. Gielen, Katholieke U. Leuven D. Pradhan, U. Bristol
IEEE Computer Society
Test Technology Technical Council

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