posted by user: Busra || 8899 views || tracked by 28 users: [display]

JEDT 2015 : International Journal of Electronic Design and Test

FacebookTwitterLinkedInGoogle

Link: http://airccse.com/jedt/index.html
 
When N/A
Where N/A
Submission Deadline Jan 15, 2016
Notification Due Feb 15, 2016
Final Version Due Feb 23, 2016
Categories    design   electronics   circuits   testing
 

Call For Papers

International Journal of Electronic Design and Test ( JEDT )


Call for Papers


International Journal of Electronic Design and Test(JEDT) is a peer-reviewed, open access journal which invites original works describing the methods used to design and test electronic product hardware and supportive software. Authors from industry and academia are invited to submit their original unpublished research works on the topics listed below:


Topics of Interest :


  • IC/module design
  • Low-power design
  • Electronic design automation
  • Design/test verification
  • Fault modelling
  • Test generation
  • Fault simulation
  • Design of testability
  • Synthesis of testability
  • Built-in self-test
  • Test specifications
  • Formal verification of hardware
  • Simulation for verification
  • Design debugging
  • Testing of VLSI devices printed circuit boards, and electronic systems
  • Testing of analog and digital electronic circuits
  • Testing of microprocessors, memories and signal processing devices
  • SOC and SIP testing
  • Memory and FPGA test and repair
  • Delay testing
  • IDDQ test
  • Novel test methods
  • Effectiveness of test methods
  • Fault models and ATPG, and DPPM prediction
  • DFT for analog/mixed signal ICs and system-on-chip
  • DFT and BIST for digital and SoC

Paper Submission:


Authors are invited to submit papers for this journal through E-mail : jedtjournal@yahoo.com (or) jedtjournal@airccse.com.Submissions must be original and should not have been published previously or be under consideration for publication while being evaluated for this Journal.


Important Dates :



Submission Deadline:January 15, 2016
Authors Notification: February 15, 2016
Final Manuscript Due:February 23, 2016
Publication Date:Determined by the Editor-in-Chief

Related Journals :


Related Resources

JEDT 2024   International Journal of Electronic Design and Test
IJME 2024   International Journal of Microelectronics Engineering
DDECS 2024   27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
CVIPPR 2024   2024 2nd Asia Conference on Computer Vision, Image Processing and Pattern Recognition
VDAT 2024   28th International Symposium on VLSI Design and Test (VDAT-2024)
ISDEA 2024   2024 3rd International Conference on Intelligent Systems Design and Engineering Applications (ISDEA 2024)
ISEEIE 2024   2024 4th International Symposium on Electrical, Electronics and Information Engineering (ISEEIE 2024)
DTTIS 2024   IEEE 2nd International conference on Design, Test & Technology of Integrated Systems
AEEGE 2024   2024 3rd International Conference on Advanced Electronics, Electrical and Green Energy (AEEGE 2024)
DAC 2024   Design Automation Conference