IDT 2013 : IEEE Design and Test Symposium
Call For Papers
Call for Papers
The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi-chip modules and printed circuit boards to full systems and microsystems. IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. IDT’13 will take place in Marrakesh, Morocco. The Symposium is initiated by and in affiliation with the IEEE Test Technology Technical Council (TTTC) and the 2013 edition is organized by The Delft University of Technology and technically sponsored by IEEE CEDA (Council on Electronic Design Automation). The official language of the conference is English.
Manuscripts describing original work on any topic from the scope of IDT are welcome. Authors are asked to submit technical papers in accordance to the author’s instructions in one of the following two conference tracks, and topics of interest include but are not limited to:
Design Methods and Tools
SOC, SIP, NOC design
Analog, Mixed Signal and RF systems
MEMS and MOEMS systems
Low Voltage and Low Power syst.
Real time systems
Simulation, Validation & Verification
System Specification and Modelling
Formal Methods and Verification
Test and Reliability
SOC and SIP testing
Memory & FPGA Test & repair
Analog and Mixed Signal testing
Defect and fault modeling
DFT, BIST and BISR
On-line testing / fault tolerant syst.
Fault Simulation, ATPG
Reliability failures/ modeling
Electronic system reliability