posted by system || 12953 views || tracked by 41 users: [display]

MICRO 2013 : The 46th Annual IEEE/ACM International Symposium on Microarchitecture

FacebookTwitterLinkedInGoogle


Conference Series : International Symposium on Microarchitecture
 
Link: http://www.microarch.org/micro46/
 
When Dec 7, 2013 - Dec 11, 2013
Where Davis, CA, USA
Abstract Registration Due May 24, 2013
Submission Deadline May 31, 2013
Categories    microarchitecture
 

Call For Papers

The 46th International Symposium on Microarchitecture is the premier forum for presenting, discussing, and debating innovative microarchitecture ideas and techniques for advanced computing and communication systems. This symposium brings together researchers in fields related to microarchitecture, compilers, chips, and systems for technical exchange on traditional microarchitecture topics and emerging research areas. The MICRO community has enjoyed a close interaction between academic researchers and industrial designers and we aim to continue this tradition at MICRO-46. In 2013, MICRO goes to Davis, California.

Important Dates:

Abstract Submission Deadline: May 24th, 2013
Paper Submission Deadline: May 31st, 2013
Author Rebuttal Period: TBD
Author Notification: TBD
Early Registration Deadline: TBD
MICRO 46 Conference: December 7th - 11th, 2013

Related Resources

MICRO 2020   International Symposium on Microarchitecture
COMMAG-FT-NanoNetworks 2021   IEEE Communications Magazine Feature Topic: Nano-Networking for Nano-, Micro-, and Macro-Scale Applications
ICQNM 2020   The Fourteenth International Conference on Quantum, Nano/Bio, and Micro Technologies
CENICS 2020   The Thirteenth International Conference on Advances in Circuits, Electronics and Micro-electronics
CAS 2020   43rd International Semiconductor Conference
MART 2020   CALL FOR TASK PARTICIPATION: MART (Micro Activity Retrieval Task) at NTCIR-15 (June 30th deadline)
COOL Chips 23   IEEE Symposium on Low-Power and High-Speed Chips and Systems
DTS 2020   2nd IEEE International Conference on Design & Test of integrated micro & nano-Systems