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S+SSPR 2008 : Joint IAPR International Workshops on Structural and Syntactic Pattern Recognition and Statistical Techniques in Pattern Recognition


When Dec 4, 2008 - Dec 6, 2008
Where Orlando, FL, USA
Submission Deadline May 4, 2008
Notification Due Jun 4, 2008
Categories    pattern recognition   machine learning

Call For Papers

Aim of the workshops
The International Association for Pattern Recognition (IAPR) and its committees on Statistical PR (TC1) and Syntactical and Structural PR (TC2) will organize the next joint workshops at the University of Central Florida (UCF), Orlando, Florida, prior to the ICPR 2008 which will be held in Tampa, Florida, only two hour distance from UCF. The joint workshops aim at promoting interaction and collaboration not only among researchers working directly in areas covered by TC1 and TC2 but also among those in other fields who use statistical, structural or syntactic techniques extensively. We welcome mathematicians, statisticians, researchers in machine learning and practitioners alike who, at present, work outside the pattern recognition community.

Topics of interest cover all aspects of the major paradigms of pattern recognition; for a non-exhaustive list, see the SPR and/or SSPR pages.

Format of the workshops

The workshops will comprise of invited talks, oral and poster presentations, and panel discussions. In addition the SSPR workshop will have a special session on graph based representation co-organized by the Technical committee on Graph Based Representations (TC15). Accepted papers will appear in the proceedings and will be distributed to all the participants during the workshops.

Submission of papers
Papers for both the workshops should describe original and unpublished work related to the topic areas of SPR, SSPR, or closely related ones. Full papers may be up to 10 (8.5 x 11") pages long and should be prepared according to the layout of the publisher. All manuscripts will be reviewed by at least two members of the SPR or SSPR program committee. Instructions for preparation and electronic submission will be available shortly on this website.

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