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MetriSec 2012 : 8th International Workshop on Security Measurements and Metrics

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Link: http://metrisec2012.cs.nku.edu/
 
When Sep 21, 2012 - Sep 21, 2012
Where Lund, Sweden
Submission Deadline May 30, 2012
Notification Due Jun 24, 2012
Final Version Due Jul 1, 2012
Categories    security metrics   empirical research   mining software repositories   information security
 

Call For Papers

MetriSec 2012
8th International Workshop on
SECURITY MEASUREMENTS AND METRICS

Affiliated with the International Symposium on
Empirical Software Engineering and Measurement (ESEM)

September 21, 2012
Lund, Sweden

WORKSHOP OVERVIEW

Quantitative assessment is a major stumbling block for software and system security. Although some security metrics exist, they are rarely adequate. The engineering importance of metrics is intuitive: you cannot consistently improve what you cannot measure. Economics is an additional driver for security metrics: customers are unlikely to pay a premium for security if they are unable to quantify what they receive.

The goal of the workshop is to foster research into security measurements and metrics and to continue building the community of individuals interested in this field. This year, MetriSec continues its co-location with ESEM, which offers an opportunity for the security metrics folks to meet the metrics community at large.

The organizers solicit original submissions from industry and academic experts on the development and application of repeatable, meaningful measurements in the fields of software and system security. The topics of interest include, but are not limited to:

Security metrics
Security measurement and monitoring
Development of predictive models
Experimental validation of models
Formal theories of security metrics
Security quality assurance
Empirical assessment of security architectures and solutions
Mining data from attack and vulnerability repositories: e.g. CVE, CVSS
Software security metrics
Static analysis metrics
Simulation and statistical analysis
Security risk analysis
Industrial experience

IMPORTANT DATES

Submission of papers: May 30
Notification to authors: June 24
Submission of camera-ready: July 1

PUBLICATION

Authors of accepted papers must present their work at the workshop. The proceedings of the workshop will be electronically published by the IEEE.

PAPER SUBMISSION

Submissions are sought in any of the following three categories:

(a) Research papers describing original results, both theoretical and experimental, are solicited in any of the above mentioned topics. Theoretical papers should clearly state the contribution and include some initial validation. Experimental papers are particularly welcome. In this case, authors are required to explicitly state their hypothesis, to detail the methodology used, and to describe the experiment set-up.

(b) Preliminary research results or new ideas can be submitted in the form of short papers.

(c) Industry experience reports are also welcome. Industry papers should have at least one author from industry or government, and will be considered for their industrial relevance.

The page limit for the final proceedings version is 10 pages in double-column format; short papers are limited to 4 pages. Authors should use the IEEE Conference Proceedings Template when preparing their submission. Only PDF files are accepted.

WORKSHOP CO-CHAIRS

James Walden - Northern Kentucky University (US)
Stephan Neuhaus - ETH Zurich (CH)

STEERING COMMITTEE

Dieter Gollmann, TU Harburg (DE)
Sushil Jajodia, GMU (US)
Guenter Karjoth, IBM (CH)
Fabio Massacci, Uni. Trento (IT)
John McHugh, Dalhousie Uni. (CA)
Riccardo Scandariato, KU Leuven (BE)
Ketil Stolen, SINTEF (NO)
Laurie Williams, NCSU (US)

PROGRAM COMMITTEE

Andrea Capiluppi, University of East London (UK)
Robert Cunningham, MIT (US)
Michael Gegick (US)
Dieter Gollmann, TU Harburg (DE)
Maureen Doyle, NKU (US)
Christophe Huygens, KU Leuven (BE)
Sushil Jajodia, GMU (US)
Erland Jonsson, Chalmers (SE)
Howard Lipson, CERT (US)
Fabio Massacci, Uni. Trento (IT)
Miles McQueen, Idaho National Laboratory (US)
Andy Meneely, NCSU (US)
Riccardo Scandariato, KU Leuven (BE)
Karen Scarfone, NIST (US)
Yonghee Shin, DePaul University (US)
Ketil Stolen, SINTEF (NO)
Jeff Stuckman, UMD (US)
Laurie Williams, NCSU (US)
Roland Yap, National University of Singapore (SG)
Nicola Zannone, Eindhoven University of Technology (NL)

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