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CCPR 2012 : Chinese Conference on Pattern Recognition

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Link: http://www.nlpr.ia.ac.cn/ccpr2012/en/index.html
 
When Sep 24, 2012 - Sep 26, 2012
Where Beijing, China
Submission Deadline May 20, 2012
Categories    pattern recognition
 

Call For Papers

The Chinese Conference on Pattern Recognition (CCPR) aims to provide a platform for academic exchange and achievements exhibition, and to promote the development of research and application on pattern recognition. The conference was held at Beijing in 2007 and 2008, Nanjing in 2009 and Chongqing in 2010. From 2012, CCPR will be held every two years.

CCPR 2012 will be held at Institute of Automation, Chinese Academy of Sciences in Beijing, from Sep. 24th, 2012 to Sep. 26th, 2012. We plan to invite several renowned experts for giving speeches and call for paper on various fields on pattern recognition. All accepted papers will be included in the conference proceedings published by IEEE and indexed by EI.
Topics include, but are not limited to:

* Basic theory of Pattern Recognition

Statistical and structural pattern recognition, neural network, kernel methods, feature extraction, dimensionality reduction and feature selection, unsupervised learning, clustering, model selection and adaption, semi-supervised learning, etc.

* Image and Video Processing

Image processing and enhancement, image and video segmentation, feature extraction for images, content based image/video retrieval, information hiding, digital watermark, etc.

* Computer Vision

Visual information processing model, scene analysis, camera calibration, 3-D vision, object detection and recognition, moving object detection and tracking, action analysis and recognition, video semantic understanding, etc.

* Speech, Language, Multimedia and Application

Speech and speaker recognition, text analysis and retrieval, character recognition and document analysis, medical image processing, remote sensing image analysis, biometric identification, multi-modality based human-computer interaction, multimedia analysis and retrieval, industrial application, etc.

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