posted by organizer: spathan || 617 views || tracked by 1 users: [display]

SI_Fault_IoV_OTJ 2025 : SI on Tools, Techniques, and Applications for Fault Tolerant and Reliable Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV), The Open Transportation Journal

FacebookTwitterLinkedInGoogle

Link: https://www.eurekaselect.com/call-for-papers-detail/6299/specialissue
 
When N/A
Where N/A
Submission Deadline Dec 31, 2024
Notification Due Mar 30, 2025
Categories    fault   reliability   vehicular   technologies
 

Call For Papers

++ Apologies, if you receive multiple copies of this CFP ++

-[Call for Papers]-

Special Issue on Tools, Techniques, and Applications for Fault Tolerant and Reliable Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV)

Journal: The Open Transportation Journal

Journal URL: https://www.sciencedirect.com/org/journal/the-open-transportation-journal

CFP link: https://www.eurekaselect.com/call-for-papers-detail/6299/specialissue

Guest Editor Team

Al-Sakib Khan Pathan, PhD (Lead Guest Editor)
United International University, Bangladesh
sakib.pathan@gmail.com

Riaz Ahmed Shaikh, PhD
University of East Anglia, UK
Riaz-Ahmed.Shaikh@uea.ac.uk

Mohiuddin Ahmed, PhD
Edith Cowan University, Australia
mohiuddin.ahmed@ecu.edu.au

Theme/Aims and Scope of the Special Issue

While numerous research works have been done on various topics of Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV), the issues related to fault tolerance and reliability need more efficient and pragmatic solutions. Fault in VANET and IoV can be caused mainly due to hardware failure or software bug or malfunction. In plain terms, fault can be defined as an error (or, irregular activity) that causes such a network to work erroneously or renders it not to provide the expected service. Again, fault tolerance is the characteristic that allows the network to operate at least at a satisfactory level so that some of the services can still be provided even after the occurrence of an error or fault. Reliability is related to this in the sense that a faultless or fault tolerant system can be preferable to be relied upon. In the existing literature, there are some sporadic efforts for addressing fault tolerance and reliability issues in VANET and IoV, and the focus is often given explicitly on security, energy-efficiency, and so on. While those other issues are somewhat intertwined with the concept of fault and reliability, and often, they impact each other directly, in this special issue (SI), we are interested in a special focus on the fault tolerant and reliable mechanisms, especially connectivity developed for VANET and IoV. There are in fact a number of tools, techniques and applications that have somewhat addressed this area in general but we hope that a special issue will offer a good platform for the researchers to publish the most recent advancements and trends in this focus area.

Topics for this SI include, but are not limited to:
- Fault tolerance ensuring tools and techniques in VANET/IoV
- Applications of fault tolerant VANET/IoV
- Ensuring reliability of VANET/IoV
- Fault detection and correction mechanisms for VANET/IoV
- Performance impact under faulty condition in VANET/IoV
- Reliability and trust in VANET/IoV
- Connectivity assurance in VANET/IoV

Important Dates

Paper submission: 31 December, 2024
Notification of Acceptance/Rejection/Revision: 30 March, 2025
Publication: TBA

Submission Instructions:

Please submit your manuscript via the online submission portal of the journal on the link provided below using the thematic issue code:
BMS-TOTJ-2024-HT-18

https://bentham.manuscriptpoint.com/journals/totj

For general guidelines for paper preparation and other author instructions, kindly visit ("FOR AUTHORS" menu): https://opentransportationjournal.com/

Also please visit: https://opentransportationjournal.com/article-processing-charges.php

++ For any query, you may directly write to the GEs.

=======================================================================

Regards,
Sakib
Lead Guest Editor

--
Al-Sakib Khan Pathan, Ph.D., SMIEEE
Editor-in-Chief: International Journal of Computers and Applications, Taylor & Francis, UK
Editor-in-Chief: Journal of Cyber Security Technology, Taylor & Francis, UK
Associate Editor: Connection Science, Taylor & Francis, UK ; IJCSE, Inderscience
Editor: AHSWN, Old City Publishing, USA ; IJSNet, Inderscience ; MJCS
All My Books: https://sites.google.com/site/spathansite/books

Professor, Department of Computer Science and Engineering
United International University (UIU), Dhaka, Bangladesh
Email: sakib.pathan@gmail.com, spathan@ieee.org
URL: https://sites.google.com/site/spathansite/

Related Resources

SOMET 2025   24th International Conference on Intelligent Software Methodologies Tools and Techniques
IJCAx 2024   International Journal of Computer-Aided technologies
EAI SIMUtools 2024   16th EAI International Conference on Simulation Tools and Techniques
ISSSR 2025   The 11th IEEE International Symposium on System Security, Safety, and Reliability
APARM 2024   11th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling
CTRQ 2025   The Eighteenth International Conference on Communication Theory, Reliability, and Quality of Service
21st AIAI 2025   21st (AIAI) Artificial Intelligence Applications and Innovations
CETA--EI 2025   2025 4th International Conference on Computer Engineering, Technologies and Applications (CETA 2025)
QRS 2025   The 25th International Conference on Software Quality, Reliability, and Security
25th EANN/EAAAI 2025   25th (EANN/EAAAI) Engineering Applications and Advances of of Artificial Intelligence