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WCRE 2011 : 18th Working Conference on Reverse Engineering

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Conference Series : Working Conference on Reverse Engineering
 
Link: http://www.cs.wm.edu/semeru/wcre2011/
 
When Oct 17, 2011 - Oct 21, 2011
Where Lero, Limerick, Ireland
Abstract Registration Due Jun 20, 2011
Submission Deadline Jun 27, 2011
Notification Due Aug 1, 2011
Final Version Due Aug 15, 2011
Categories    reverse engineering   software
 

Call For Papers

We invite original research papers in all areas of software maintenance, evolution, reengineering, and migration.

Topics of interest include, but are not limited to:

- Program Comprehension
- Reengineering to distributed systems
- Mining software repositories
- Software architecture recovery
- Empirical studies in reverse engineering
- Visualization techniques and tools
- Concept and feature location
- Object and aspect identification
- Binary reverse engineering
- Program analysis and slicing
- Redocumenting legacy systems
- Reengineering patterns
- Model-driven reengineering
- Program transformation and refactoring
- User interface reengineering
- Dynamic analysis
- Wrapping techniques
- Data reverse engineering
- Preprocessing, parsing and fact extraction
- Reverse engineering for security assessment
- Reverse engineering tool support
- Education in reverse engineering
- Reverse engineering of service-oriented systems
- Performance re-engineering

Technical papers should describe original and significant work in the research and practice of reverse engineering. Papers should be limited to 10 proceedings pages. Papers must not have been previously published nor have been submitted to, or be in consideration for, any journal, book, or other conference. Papers will be evaluated by members of the program committee based on their originality, technical soundness and quality of presentation. Papers must conform to the IEEE proceedings paper format guidelines. If the paper is accepted, at least one author is expected to attend the conference and to present the paper. WCRE accepted papers will appear in the IEEE Digital Library.

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