posted by user: cmuthu_urv || 4095 views || tracked by 3 users: [display]

SCD 2011 : Semiconductor Conference Dresden

FacebookTwitterLinkedInGoogle

Link: http://www.gerotron.de/html/messen/scd.htm
 
When Sep 27, 2011 - Sep 28, 2011
Where Dresden, Germany
Submission Deadline Mar 1, 2011
Notification Due Jul 1, 2011
Final Version Due Aug 1, 2011
Categories    semiconductor
 

Call For Papers

Major Topics

Integrated Circuit and System Design:
Mixed-signal, analogue and digital circuits and systems for high speed and/or low power consumption, adaptive power management, RF up to sub-THz, low costs, and advanced performance and density, circuits in More than Moore and Beyond Moore technologies.

Interconnection Technologies:
Wire bonding, flip chip (eutectic/lead-free solders), solder replacement flip chip (ICP, ACP, ACF, NCP), under bump metallurgy, high density substrates, microvia, build-up technologies, substrate metallurgy, embedded passives & actives, wafer/device level, MEMS, 3-D and novel interconnects.

Advanced System and Wafer Level Packaging:
New packaging technologies for single chip, multi-chip, wafer level, power and stacked-die packages addressing fine pitch, high I/O and performance issues, low loss interconnects and bonding techniques.

Optical Devices and Photonics:
Optical component assemblies, electro-optical modules, waveguides, silicon based photonic devices, organic devices.

Semiconductor Technologies, Materials and Processes:
CMOS, SiGe, More than Moore (silicon on insulator, strained silicon, multi-gate transistors) and Beyond Moore including carbon nano tubes, silicon nanowire, organic, polymer and ink-jet printed electronics, power devices (GaN, GaP), advances and application of adhesives, encapsulants, underfills, solder alloys, halogen-free materials, dielectrics, thin films, ceramics, composites, nano-materials, optical materials and characterization techniques, wafer (prime) production.

Assembly and Manufacturing Technologies:
Wafer bumping and thinning, process characterization, cost and cycle time reduction, etc..

Quality and Reliability:
Component, board and system level reliability assessment, failure analysis, interfacial adhesion, accelerated testing and
models, component and system qualification.

Modeling and Simulation:
EDA, TCAD, electrical, thermal, thermo-mechanical, reliability, optical, modeling and simulation for devices, component and system level applications.

Related Resources

ICDM 2024   24th Industrial Conference on Data Mining
OPTLJ 2024   Integrated Optics and Lightwave : An International Journal
MLDM 2024   20th International Conference on Machine Learning and Data Mining
MDA 2024   19th International Conference on Mass Data Analysis of Images and Signals with Applications in Medicine, r/g/b Biotechnology, Food Industries and Dietetics, Biomet
Gen AI in Finance SI PDW 2024   Generative AI in Finance SI Paper Development Workshop
SOCC 2024   37th IEEE International System-on-Chip Conference
CAS 2024   International Semiconductor Conference
LAEDC 2024   IEEE LATIN AMERICAN ELECTRON DEVICES CONFERENCE
8th Crowdinvesting Symposium 2024   8th Crowdinvesting Symposium
ICDCM 2024   International Conference on Diamond and Carbon Materials