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ICMV 2010 : 2010 The 3rd International Conference on Machine Vision 2nd round call for paper | |||||||||||||||||
Link: http://www.ijcte.org/icmv/cfp.htm | |||||||||||||||||
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Call For Papers | |||||||||||||||||
Topics of interest for submission include, but are not limited to:
Machine Vision, Image Processing, and Pattern Analysis Imaging Sensors Color and Texture Analysis Segmentation Motion and Tracking Stereo Vision Biometrics Recognition Image-Based Modeling Calibration and Geometry Illumination and Reflectance Modeling Soft Computing for Machine Vision Physics-Based Modeling Artificial Intelligence for Machine Vision Video Analysis Face and Gesture Recognition Action and Event Recognition Similarity/Dissimilarity Metrics Machine Learning Performance Evaluation Medical Image Analysis Image and Video Retrieval Structure from Motion Image Registration Image Enhancement Clustering Morphology and Blob Analysis Applications of Machine Vision Computer Vision and Image Analysis Active Vision Early Vision Feature Extraction Motion Analysis Representation Recognition (2D and 3D) Texture and Colour Scene Understanding Segmentation Shape from X Visual Navigation Pattern Recognition and Basic Technologies Statistical Pattern Recognition Structural and Syntactic Pattern Recognition Neural Networks Machine Learning and Data Mining Artificial Intelligence and Symbolic Learning Classification and Clustering Feature Selection, Dimensionality Reduction, Manifold Learning Kernel Methods and Support Vector Machines Invariance in Recognition Multiresolution Techniques OCR, Document Analysis and Understanding Information Retrieval Benefits of the Conference Keep up-to-date on the latest advances in the field. Present your research within a unique forum. Collaborate with experts from around the world. Submitted conference papers will be reviewed by technical committees of the Conference. All accepted papers will also be published in the conference proceeding by Conference Publishing Services. The ICMV 2010 proceedings will be included in the IEEE Xplore, and indexed by the INSPEC, Ei Compendex and Thomson ISI. A selection of the best papers will be invited for a special issue in a mainstream journal.. |
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