posted by user: amamory || 8417 views || tracked by 26 users: [display]

VTS 2011 : IEEE VlSI Test Symposium

FacebookTwitterLinkedInGoogle


Conference Series : VLSI Test Symposium
 
Link: http://www.tttc-vts.org
 
When May 1, 2011 - May 5, 2011
Where Dana Point, USA
Submission Deadline Sep 19, 2010
Notification Due Nov 28, 2010
Categories    VLSI   embedded systems
 

Call For Papers

Major topics include, but are not limited to:

# Analog, Mixed-Signal & RF Test
# ATPG & Compression
# ATE Architecture & Software
# Board & System Test
# Built-In Self-Test (BIST)
# Current Based Test
# Defect/Fault Tolerance & Self-Repair
# Delay & Performance Test
# Design for Testability (DFT)
# Design Verification/Validation
# Diagnosis and Debug
# Embedded System and Microsystems Test
# Embedded Test Methods
# Emerging Technologies Test
# FPGA Test
# Fault Modeling and Simulation
# Infrastructure IP
# Low-Power IC Test
# MEMS And Sensor Test
# Memory Test and Repair
# On-Line Test
# Power Issues in Test
# System-on-Chip (SOC) Test
# System-in-Package Test
# Standards
# Test Economics
# Thermal Test
# Test of Biomedical Devices
# Test of High-Speed I/O
# Test Quality and Reliability
# Test Resource Partitioning
# Transients & Soft Errors

Related Resources

VTS 2021   39th IEEE VLSI Test Symposium
IJPLA 2020   International Journal of Programming Languages and Applications
CYBI 2021   8th International Conference on Cybernetics & Informatics
VTS 2020   IEEE VLSI Test Symposium
DATE 2021   Design, Automation and Test in Europe Conference
IJESA 2020   International Journal of Embedded Systems and Applications
VDAT 2020   24th International Symposium on VLSI Design and Test
ELELIJ 2020   Electrical and Electronics Engineering: An International Journal
DATE 2020   Design, Automation, and Test in Europe
EMSA 2021   10th International Conference on Embedded Systems and Applications