Rationale
The aim of the conference Statistics and Machine Learning in Electronics is to bring together young and experienced researchers, students and educators with interests in how statistics, machine learning and fuzzy logic could facilitate analysis, design, testing, diagnosis, measurement and manufacturing of electronic circuits, modules and devices. Final scientific results and research in progress will be presented and discussed, revealing new models, methods, algorithms, techniques, and methodologies. The conference is base for forming an international scientific network, spreading new and innovative ideas and the best practices.

Topics
Statistics, machine learning and fuzzy logic methods, algorithms, techniques, methodologies, models in:
- Electronic circuit design
- Electronic circuit analysis
- Electronic circuits and devices testing and diagnosis
- Electronics circuits and devices measurement
- Manufacturing of electronic components and devices
- Electronic process management
- Quality management in electronics
- Digital twins