posted by user: dubeyhc || 2079 views || tracked by 1 users: [display]

IMS3TW 2010 : 16th International Mixed-Signals, Sensors and Systems Test Workshop

FacebookTwitterLinkedInGoogle

Link: http://ims3tw.tttc-events.org
 
When Jun 7, 2010 - Jun 9, 2010
Where La Grande Motte, France
Submission Deadline Feb 19, 2010
Notification Due Apr 9, 2010
Final Version Due May 14, 2010
Categories    power systems   power transmission   power distribution
 

Call For Papers

One and a half decades ago, the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated as a forum focused on test and design issues related to electronic systems with digital and analog components. In view of accelerated developments in heterogeneous system design and production, IMSTW was expended in 2008 to include new topics that address test, design for test, reliability and manufacturability of today’s sensors and sensor-based systems, as well as emerging devices and systems. Renamed to include sensors and systems, IMS3TW aims to bring together a community of researchers working on the next-generation of devices, circuits and systems. This year, IMS3TW will continue to address the traditional technology spectrum of IMSTW, in particular all aspects of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, temperature effects). To guaranteeing design robustness for the new generation of nanoelectronic devices, we need to exploit self-monitoring functionality (such as self-test/-calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. The sensors focus of the workshop will highlight all aspects of built-in sensors for device adaptation, MEMS, and biomedical applications such as lab-on-chip and implantable devices.
Primary Topics of Interest include:

Test & Design for (on/off-line) Test

Verification & Design for Verification

Reliability & Design for Reliability


Monitoring/Diagnosis & Design for Debug/Diagnosis

Fault and Error Modelling & Simulation


Fault Tolerance

Pertaining to the following systems or underlying technologies:

Analog/Mixed-Signal Circuits
Biomedical Circuits & Systems

Lab-on-Chip
MEMs

RF & Wirelessly Controlled Devices


Microfluidics

Optoelectronics & Photonics


Heterogeneous Systems

Drug Delivery Microsystems


Implantable Devices

Key Dates

Submission deadline: February 19, 2010
Notification of acceptance: April 9, 2010
Camera-ready full papers: May 14, 2010

Related Resources

Sensors journal 2025   Special Issue on Energy-Efficient Communication Networks and Systems: 2nd Eition
CYBI 2025   12th International Conference on Cybernetics & Informatics
DSA 2025   The 12th International Conference on Dependability Systems and Their Applications
ITPES 2025   The 1st International Symposium on Intelligent Technology for Power and Energy Systems
ACM SAC 2025   40th ACM/SIGAPP Symposium On Applied Computing
PEET 2025   IEEE--2025 International Conference on Power Engineering and Electrical Technology (PEET 2025)
ASPLOS 2026   The ACM International Conference on Architectural Support for Programming Languages and Operating Systems - Summer
IEEE AI TEST 2025   7th IEEE International Conference on Artificial Intelligence Testing
ICPRS 2025   15th International Conference on Pattern Recognition Systems
IJIBM 2025   IJIBM 2025 : Call For Papers - International Journal of Information, Business and Management