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HVEI 2018 : Human Vision and Electronic Imaging | |||||||||||
Link: http://www.imaging.org/site/IST/IST/Conferences/EI/EI_2018/Conference/C_HVEI.aspx | |||||||||||
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Call For Papers | |||||||||||
Human Vision and Electronic Imaging 2018
Hyatt Regency Hotel--San Francisco Airport, Burlingame, CA USA January 28 - February 1, 2018 http://www.imaging.org/site/IST/IST/Conferences/EI/EI_2018/Conference/C_HVEI.aspx http://hvei.eecs.northwestern.edu/ HVEI is a conference, and a community, dedicated to research at the intersection of human vision/cognition, imaging technologies and aesthetics/art. The conference runs for four days, with peer-reviewed technical presentations and posters punctuated with interactive discussions, panels, short courses, and social activities. Every year, special invited sessions introduce new topics to the HVEI community, broadening the dialogue and encouraging new areas of research. For more information about HVEI, including programs from previous conferences, check out the HVEI web site: http://hvei.eecs.northwestern.edu/ HVEI's goal is to enable communication and collaboration across disciplines. HVEI authors and attendees come from academic departments in computer science, imaging science, engineering, psychology, cognitive neuroscience and art; they also come from high tech and government laboratories, and from art studios and start-ups. Planned Special Sessions in 2018: o Virtual/augmented reality (Mark McCourt and Kjell Brunnstrom) o Visual intelligence, lighting, and materials (Sylvia Pont) o Veridicality, Perception, Art, and Representation (Claus-Christian Carbon and Huib DeRidder) o Eye-Movement Research for Advanced Imaging Applications (Jeff Mulligan) ***Celebratory Events Marking the 30th Anniversary of HVEI*** Monday evening HVEI Banquet and Talk (details available closer to the conference); Museum excursion to SFMOMA, to explore the interplay between perception, cognition and art. ***HVEI Journal of Perceptual Imaging*** We are proud to announce the launch of a new journal--the Journal of Perceptual Imaging--founded and inspired by, and designed to cater to, the HVEI community. Starting this year, there is an option to submit to the Journal of Perceptual Imaging^ and present your work at the conference. ^The same September 25th deadline applies. Please select the JPI-First option during the submission. Conference Topics: o Fundamental and applied research in human perception and cognition, including psychophysical, neurophysiological, and computational approaches to human spatial, temporal, color, and stereo perception o Visual, auditory, haptic, olfactory and taste perception, and cross-sensory interactions o Perceptually-based algorithms, metrics and methods for image and video quality and compression; image and video analysis and understanding; texture, lighting, and material appearance; and rendering o Visual cognition, including visual attention and saliency, visual search, pattern recognition, perceptual organization and semantics o Higher-level issues in image quality, include quality of experience, aesthetics, emotion, and context o Perceptual and cognitive opportunities for emerging technologies, including social networks, big data visualization, data analytics, medical imaging, mobile computing, and digital humanities o Perception, art, and aesthetics, including fine arts and design, integrating artistic and scientific insights on perceptual phenomena Submission and Publications 1. All accepted papers are published in the proceedings of Electronic Imaging or the Journal of Electronic Imaging. 2. Authors must submit a 4-6-page paper with optional figures using the symposium template. Consideration for inclusion in the Journal of Perceptual Imaging has additional requirements; please see the submission site. Important Dates: Extended submission deadline: 25 September 2017 Author notification: October - November 2017 Conference dates: 28 January - 1 February 2018 Conference Chairs: Bernice Rogowitz, Visual Perspectives (United States) Thrasyvoulos Pappas, Northwestern University (United States) Huib de Ridder, Technische Universiteit Delft (Netherlands) |
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