International Conference on Security of Smart cities, Industrial Control System and Communications (SSIC 2016) is the second conference in the area of cyber security focusing on the industry control system, cloud platform and smart cities. City and industrial control infrastructures are changing with new interconnected systems for monitoring, control and automation. The conference will provide an international forum for scientists, researchers, professionals, industry practitioners, policy makers, and users to exchange ideas, techniques and tools, and share experience related to all practical and theoretical aspects of communications and network security. SSIC’2016 will take place on July 18 - 19, 2016, in Paris, France.

SSIC'2016 conference is technically co-sponsored by IEEE. All accepted papers will be published in IEEE Xplore. SSIC 2016 seeks original high-quality technical papers from academia, government, and industry. Topics of interest encompass not only all practical and theoretical aspects of communications, and network security, but also security mechanism put into some critical applications. Particular topics of interest include, but are not limited to:

- Smart City Security, including security architecture and model, Intrusion Detection and other related topics.
- Smart Grid security, including security architecture and model, Intrusion Detection, big data analysis of smart grids, and so on.
- Industrial control system information security, including Security Monitoring and Control, Security Evaluation, SCADA/DCS security architecture, Intrusion Detection.
- Cloud computing security and privacy implications
- Wireless networks security and privacy
- Internet of Things (IoT) security
- Vehicular network security
- RFID network security
- Social networks
- Communication protocols of wired, wireless and vehicular networks
- Other topics related to security, trust and privacy

Technical Program Committee

Sherali Zeadally, University of Kentucky, USA
Marina Krotofil, European Network for Cyber Security, Netherlands
Jassim Happa, Oxford University, United Kingdom
Olivier Vogel, Schneider Electric, France
Jinzhu Chen, General Motors Research & Development, USA
Zhi Xue, Shanghai Jiao Tong University, China
Waseem Abbas, Vanderbilt University, USA
Luca Durante, CNR-IEIIT, Italy
Patrick Lallement, University of Technology of Troyes, France
Priyadarsi Nanda, University of Technology, Sydney, Australia
Gongliang Chen, Shanghai Jiao Tong University, China
Kewei Sha, University of Houston, USA
Houda Labiod, Telecom Paristech, France
Maria Sokhn, University of Applied Sciences and Arts Western Switzerland
Yue Wu, Shanghai Jiao Tong University, China
Pascal Urien, Telecom ParisTech, France
Xinming Ou, University of South Florida, USA
Farid Naït-Abdesselam, University of Paris Descartes, France
Shenghong Li，Shanghai Jiao Tong University, China
Mohamad Badra, Zayed University, UAE
Guy Pujolle, University Pierre et Marie Curie - Paris 6, France
Wenjia Li, New York Institute of Technology, USA
Pascal Lorenz, University of Haute-Alsace, France
Bijan Jabbari, George Mason University, USA
Ahmed Serhrouchni, Telecom ParisTech, France
Nitin Maslekar, NEC Laboratories Europe, Heidelberg, Germany
Brigitte Lonc, Renault, France
Lyes Khoukhi, University of Technology of Troyes, France
Muhammad Imran, King Saud University, KSA
Ken Chen, University Paris 13, France
Junhua Tang, Shanghai Jiao Tong University, China