ESREF 2014 : 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

posted by user: VDE || 6504 views || tracked by 6 users: [display]

ESREF 2014 : 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

Link: http://www.esref2014.org

When	Sep 30, 2014 - Oct 3, 2014
Where	Berlin
Submission Deadline	Mar 25, 2014
Notification Due	May 5, 2014
Final Version Due	Jun 20, 2014

Categories electron devices reliability failure physics analysis

Call For Papers

This international symposium continues to focus on recent developments
and future directions in quality and reliability management of
materials, devices and circuits for micro, nano, and optoelectronics.
It provides a European forum for developing all aspects of reliability
management and innovative analysis techniques for present and future
electronic applications.

Related Resources

IEEE ICCCAS 2025 2025 IEEE the 14th International Conference on Communications, Circuits, and Systems (ICCCAS 2025)

SIPO 2025 9th International Conference on Signal, Image Processing

JANT 2024 International Journal of Antennas

ISSSR 2025 The 11th IEEE International Symposium on System Security, Safety, and Reliability

ICEDA--EI 2024 2024 4th International Conference on Electron Devices and Applications (ICEDA 2024)

CTRQ 2025 The Eighteenth International Conference on Communication Theory, Reliability, and Quality of Service

QRS 2025 The 25th International Conference on Software Quality, Reliability, and Security

ICICM 2024 IEEE--2024 The 9th International Conference on Integrated Circuits and Microsystems (ICICM 2024)

EEET 2024 CPS--2024 7th International Conference on Electronics and Electrical Engineering Technology (EEET 2024)

SI_Fault_IoV_OTJ 2025 SI on Tools, Techniques, and Applications for Fault Tolerant and Reliable Vehicular Ad-hoc Networks (VANET) and Internet of Vehicles (IoV), The Open Transportation Journal