With recent advancements in the CMOS and allied novel technologies, major research and development efforts are ongoing in the field of VLSI and Embedded Systems. Challenges faced by conventional CMOS technology are being overcome by new architectures, algorithms, implementation methodologies, re-configurability, devices and processes. Research in this area spans many levels of abstraction: from basic design concepts to circuit and system design, fabrication, testing and standardization.

International Conference on Advances in VLSI and Embedded Systems (AVES-2019) is the premier forum for the presentation of new advances and research results in aforementioned fields. It aims to bring together leading researchers, engineers and scientists in the domain of VLSI Design and Embedded Systems from around the world. It also consolidates finest keynote speeches and plenary talks on radical topics in VLSI and Embedded Systems under a common umbrella.

AVES-2019 will be organized at Sardar Vallabhbhai National Institute of Technology, Surat, Gujarat, India, on December 20-21 2019. It is technically sponsored by Springer.

Prospective authors are encouraged to submit their original, unpublished research manuscripts (which is not under review in any other Conference/ Journal) of the given tracks in the format specified in the Springer Paper Template through CMT for possible presentation and publication in AVES-2019

Paper Tracks:

VLSI Design:
System-level design, Advances in digital de-sign, Low power design, Analog and mixed signal design, FPGA design and reconfigurable systems, RF/Wireless systems, System-on-chip designs, Networks-on-chip Design

Devices and Emerging Technology
Semiconductor device simulation, Device modeling, Fabrication and characterization, Device-circuit interactions, Sensors and transducers, MEMS / NEMS, Organic Electronics, Spintronics, 2-D material for electronic devices, Device physics design and circuits using non-silicon materials, Fabrication and packaging technologies

Testing and Verification
Design for testability, Test generation and fault simulation, Built-in self-test, Verification (simulation and formal), Design for manufacturability and yield analysis, Testing memories and regular logic arrays

Embedded Systems
Embedded systems for industrial automation and power electronics, Embedded systems for defence, healthcare, automotive and signal processing, Technologies for secure embedded circuits and systems, IoT and wearable devices, High performance embedded systems

CAD for VLSI
Logic and behavioural synthesis, Placement, routing and floor planning; CAD tools, De-sign automation