I MTC 2013 spans research, development, and applications in the field of instrumentation
and measurement science and technology. Medical and life science applications will be the
2013 emphasis. The conference includes Industrial Tracks where research can merge with the
practical applications of industrial technology used every day, to foster the exchange of
know-how between industry and academia.
Paper contests will be held including a Conference Best Paper Award as well as Student Best
Poster Awards, with cash awards for best papers/posters.
We are seeking presentations and papers to explore topics related to the instrumentation
and measurement aspects of Advances in Instrumentation and Measurement Developments
and Techniques Biomedical Systems Data Acquisition Systems and Techniques Energy
and Power Systems Industrial Process Control Measurement and Instrumentation for
Industrial Applications Measurement Applications Measurement of Electric and Magnetic
Quantities Measurement of Materials and Mechanical Quantities Measurement,
Instrumentation and Methodologies Related to Healthcare Systems Measurement Systems
and Theory Medical Instrumentation Non-invasive Measurement Techniques and
Instrumentation Real-Time Measurement Robotics and Controls Sensors and Sensor
Fusion Signal & Image Processing Techniques Software Development for Measurement
and Instrumentation Support Techniques related to Instrumentation Transducers Virtual
Measurement Systems Wireless Sensors and Systems.
Given that the 2013 conferences theme is “Instrumentation and Measurement for Life” we
strongly encourage submissions in the areas of medical, biomedical and healthcare
instrumentation, measurement, system development and recent advances.
Prospective authors are invited to submit extended abstracts (3-4 pages) via the I MTC
conference website http://imtc.ieee-ims.org. The abstract should report on original research
results of theoretical or applied nature and should explain the significance of the contribution
to the research field. The manuscripts must be prepared according to guidelines provided on
the I MTC website.
The extended abstracts will be reviewed by the Technical Program Committee. All papers
presented at the conference will be published in the Conference Proceedings and via IEEE
Xplore.
In addition to papers, the conference will also have Tutorials and Exhibits covering the entire
range of instrumentation and measurement technology.
We seek company sponsors to partner with us to bring instrumentation closer to those who
use this exciting technology.