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VTS 2013 : IEEE 31st VLSI Test Symposium | |||||||||||||||
| Link: http://www.tttc-vts.org | |||||||||||||||
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Call For Papers | |||||||||||||||
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The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic
circuits and systems. Major topics include, but are not limited to: • Analog, Mixed-Signal & RF Test • ATPG & Compression • ATE Architecture & Software • Built-In Self-Test (BIST) • Defect & Current Based Test • Defect/Fault Tolerance • Delay & Performance Test • Design for Testability (DFT) • Design Verification/Validation • Diagnosis and Debug • Embedded System & Board Test • Embedded Test Methods • Emerging Technologies Test • FPGA Test • Fault Modeling and Simulation • Hardware Security • Low-Power IC Test • Microsystems, MEMS and Sensor Test • Memory Test and Repair • On-Line Test & Error Correction • Power and Thermal Issues in Test • System-on-Chip (SOC) Test • Test Standards • Test Economics • Test of Biomedical Devices • Test of High-Speed I/O • Test Quality and Reliability • Test Resource Partitioning • Transients and Soft Errors • 2.5D, 3D and SiP Test |
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