posted by organizer: AjitaR || 1273 views || tracked by 2 users: [display]

IEEE IJCB 2024 : CFP- IEEE International Joint Conference on Biometrics 2024

FacebookTwitterLinkedInGoogle

 
When Sep 15, 2024 - Sep 18, 2024
Where Buffalo/Niagara Falls, New York
Submission Deadline Mar 15, 2024
Notification Due May 17, 2024
Final Version Due Jun 30, 2024
 

Call For Papers


About IJCB 2024
The IEEE International Joint Conference on Biometrics (IJCB) is the premier international forum for research in biometrics and related technologies. It combines two major biometrics conferences, the IEEE Biometrics Theory, Applications, and Systems (BTAS) conference and the International Conference on Biometrics (ICB) and is made possible through a special agreement between the IEEE Biometrics Council and the IAPR TC-4. IJCB 2024 is the 8th iteration of this major joint event and will be held in Buffalo/Niagara Falls, New York, United States, between September 15-18, 2024 as an in-person conference.

For more details, please visit: https://ijcb2024.ieee-biometrics.org/

Call for Contributions
IJCB 2024 is intended to have a broad scope and invites papers that advance biometric technologies, sensor design, feature extraction, and comparison algorithms, security and privacy, and the social impact of biometrics technology. Topics of interest include, but are not limited to:

⮚ Face, Iris, Fingerprint, Palmprint
⮚ Periocular, Ear, Vein, Speech
⮚ Behavioral and Gait Recognition
⮚ Human Action Recognition
⮚ Multi-modal and Multi-Spectral Biometrics
⮚ Mobile-based Biometrics
⮚ Biometrics at Altitude and Range
⮚ Attribute prediction via biometric modalities
⮚ Template Protection and Cryptosystems
⮚ Privacy, Demographic Bias, Fairness
⮚ Biometrics Explainability and Interpretability
⮚ Template Design, Selection and Update
⮚ Datasets, Evaluation, Benchmarking
⮚ Performance Modeling and Prediction
⮚ Large Scale ID Management
⮚ Presentation Attack Detection (e.g. Anti-spoofing), Morphing Attack Detection
⮚ Biometric DeepFakes, Digital Data Forensics
⮚ Biometric-related Law Enforcement and Forensics
⮚ Biometrics in Healthcare, Banking, IoT
⮚ Synthetic Data & Realities for Biometrics
⮚ Ethical, Social and Legal Issues
⮚ Biometrics for social good

Paper Submission
Submitted papers may not be accepted or under review elsewhere. Submissions may be up to eight pages, plus additional references, in IEEE conference format. Please visit the submission page for additional details on paper formatting. Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements.

Submission is through CMT - https://cmt3.research.microsoft.com/IJCB2024/.

Timeline
Paper submission: March 15, 2024
Supplementary material: March 22, 2024
Review comments to authors: April 30, 2024
Rebuttal deadline: May 7, 2024
Decisions to authors: May 17, 2024
Camera-ready papers due: June 30, 2024

Related Resources

IEEE BDAI 2025   IEEE--2025 the 8th International Conference on Big Data and Artificial Intelligence (BDAI 2025)
SACI 2025   19th IEEE International Symposium on Applied Computational Intelligence and Informatics
IEEE ICRAS 2025   IEEE--2025 9th International Conference on Robotics and Automation Sciences (ICRAS 2025)
IEEE/ION PLANS: AI-Enhanced Navigation 2025   IEEE/ION PLANS: TRACK D - Applications of Localization Technologies - AI-Enhanced Navigation
BDAI 2025   IEEE--2025 the 8th International Conference on Big Data and Artificial Intelligence (BDAI 2025)
SPIE-Ei/Scopus-CMLDS 2025   2025 2nd International Conference on Computing, Machine Learning and Data Science (CMLDS 2025) -EI Compendex & Scopus
IEEE IRCE 2025   IEEE--2025 The 8th International Conference on Intelligent Robotics and Control Engineering (IRCE 2025)
IEEE CCAI 2025   IEEE--2025 5th International Conference on Computer Communication and Artificial Intelligence (CCAI 2025)
IEEE SEAI 2025   2025 5th IEEE International Conference on Software Engineering and Artificial Intelligence (SEAI 2025)
ICCAD 2025   2025 9th IEEE/IFAC/DBLP International Conference on Control, Automation and Diagnosis