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AES 2019 : The 7th Advanced Electromagnetics Symposium | |||||||||||
Link: https://mysymposia.org | |||||||||||
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Call For Papers | |||||||||||
AES 2019, the 7th Advanced Electromagnetics Symposium will serve as an international multidisciplinary forum for the exchange of information on state-of-the-art research in antennas, propagation, electromagnetic engineering, and radio science. AES 2019 topics include, but are not limited to: Track 1: Antennas Analysis, design, and development of antennas and arrays Wide-band antennas Empirical, theoretical, and computational models of antennas Material properties and their applications in antennas Reconfigurable and tunable antennas, optical and nano antennas Antenna arrays and MIMO systems Signal processing for antennas Track 2: Wave Propagation Theoretical and computational methods for wave propagation and sensing Characterization of propagation channels Applications in wireless communications, radar, and imaging systems Multiple antenna systems for spatial, polarization, pattern,... Track 3: Measurements Measurement techniques for antennas, radiation, propagation, and scattering Specification, and standards Visualization of electromagnetic entities Near-field and novel measurement techniques Track 4: Electromagnetics Fundamental and advanced theory Radiation, scattering, radar cross section, propagation, and interaction with all media Inverse scattering and target identification Electromagnetic absorbers and artificial materials (metamaterials,...) Computational electromagnetics, fast algorithms, and CAD packages Educational Electromagnetics Track 5: Microwaves, Millimeter Waves, and THz Solid state circuits, low-noise circuits, and high-power circuits, monolithic integrated circuits passive circuits, packaging, interconnects, MCMs, and MEMS Ferrite and SAW components, superconducting components and technology Microwave-Optical design, high speed digital circuits and SI, submillimeter wave techniques THz technology, measurement, and imaging Track 6: EMC & EMI EMC and EMI modeling, EMC test methods in industry, environment, near-field probers, functional safety NF scanning for PCB characterization,... |
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