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VALID 2012 : The Fourth International Conference on Advances in System Testing and Validation Lifecycle | |||||||||||||||
Link: http://www.iaria.org/conferences2012/VALID12.html | |||||||||||||||
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Call For Papers | |||||||||||||||
Complex distributed systems with heterogeneous interconnections operating at different speeds and based on various nano- and micro-technologies raise serious problems of testing, diagnosing, and debugging. Despite current solutions, virtualization and abstraction for large scale systems provide less visibility for vulnerability discovery and resolution, and make testing tedious, sometimes unsuccessful, if not properly thought from the design phase.
The conference on advances in system testing and validation considers the concepts, methodologies, and solutions dealing with designing robust and available systems. Its target covers aspects related to debugging and defects, vulnerability discovery, diagnosis, and testing. The conference VALID 2012 continues a series of events focusing on designing robust components and systems with testability for varia features of behavior and interconnection. The conference will provide a forum where researchers shall be able to present recent research results and new research problems and directions related to them. The conference seeks contributions presenting novel result and future research in all aspects of robust design methodologies, vulnerability discovery and resolution, diagnosis, debugging, and testing. We solicit both academic, research, and industrial contributions. We welcome technical papers presenting research and practical results, position papers addressing the pros and cons of specific proposals, such as those being discussed in the standard fora or in industry consortia, survey papers addressing the key problems and solutions on any of the above topics short papers on work in progress, and panel proposals. Industrial presentations are not subject to the format and content constraints of regular submissions. We expect short and long presentations that express industrial position and status. Tutorials on specific related topics and panels on challenging areas are encouraged. The topics suggested by the conference can be discussed in term of concepts, state of the art, research, standards, implementations, running experiments, applications, and industrial case studies. Authors are invited to submit complete unpublished papers, which are not under review in any other conference or journal in the following, but not limited to, topic areas. All topics and submission formats are open to both research and industry contributions. Robust design methodologies Designing methodologies for robust systems Secure software techniques Industrial real-time software Defect avoidance Cost models for robust systems Design for testability Design for reliability and variability Design for adaptation and resilience Design for fault-tolerance and fast recovery Design for manufacturability, yield and reliability Design for testability in the context of model-driven engineering Vulnerability discovery and resolution Vulnerability assessment On-line error detection Vulnerabilities in hardware security Self-calibration Alternative inspections Non-intrusive vulnerability discovery methods Embedded malware detection Defects and Debugging Debugging techniques Component debug System debug Software debug Hardware debug System debug Power-ground defects Full-open defects in interconnecting lines Physical defects in memories and microprocessors Zero-defect principles Diagnosis Diagnosis techniques Advances in silicon debug and diagnosis Error diagnosis History-based diagnosis Multiple-defect diagnosis Optical diagnostics Testability and diagnosability Diagnosis and testing in mo bile environments System and feature testing Test strategy for systems-in-package Testing embedded systems Testing high-speed systems Testing delay and performance Testing communication traffic and QoS/SLA metrics Testing robustness Software testing Hardware testing Supply-chain testing Memory testing Microprocessor testing Mixed-signal production test Testing multi-voltage domains Interconnection and compatibility testing Testing techniques and mechanisms Fundamentals for digital and analog testing Emerging testing methodologies Engineering test coverage Designing testing suites Statistical testing Functional testing Parametric testing Defect- and data-driven testing Automated testing Embedded testing Autonomous self-testing Low cost testing Optimized testing Testing systems and devices Test standards Testing of wireless communications systems Testing of mobile wireless communication systems Testing of wireless sensor networks Testing of radio-frequency identification systems Testing of ad-hoc networks Testing methods for emerging standards Hardware-based prototyping of wireless communication systems Physical layer performance verification On-chip testing of wireless communication systems Modeling and simulation of wireless channels Noise characterization and validation Case studies and industrial applications of test instruments Software verification and validation High-speed interface verification and fault-analysis Software testing theory and practice Model-based testing Verification metrics Service/application specific testing Model checking OO software testing Testing embedded software Quality assurance Empirical studies for verification and validation Software inspection techniques Software testing tools New approaches for software reliability verification and validation Testing and validation of run-time evolving systems Automated testing for run-time evolving systems Testing and validation of evolving systems Testing and validation of self-controlled systems Testing compile-time versus run-time dependency for evolving systems On-line validation and testing of evolving at run-time systems Modeling for testability of evolving at run-time systems Near real-time and real-time monitoring of run-time evolving systems Verification and validation of reflective models for testing Verification and validation of fault tolerance in run-time evolving systems Feature-oriented testing Testing user interfaces and user-driven features Privacy testing Ontology accuracy testing Testing semantic matching Testing certification processes Testing authentication mechanisms Testing biometrics methodologies and mechanisms Testing cross-nation systems Testing system interoperability Testing system safety Testing system robustness Testing temporal constraints Testing transaction-based properties Directed energy test capabilities /microwave, laser, etc./ Testing delay and latency metrics; Domain-oriented testing Testing autonomic and autonomous systems Testing intrusion prevention systems Firewall testing Information assurance testing Testing social network systems Testing recommender systems Testing biometric systems Testing diagnostic systems Testing on-line systems Testing financial systems Testing life threatening systems Testing emergency systems Testing sensor-based systems Testing testing systems |
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