Each year, the MEDIAN project Workshops provide an event where ideas are exchanged and discussed, and new cooperations are created as researchers from the academic and industrial domains share their recent findings, theories and on-going scientific and practical works in the dependable system designs and their applications. Constant advances in manufacturing yield and field reliability are important enabling factors for electronic devices pervading our lives, from medical to consumer electronics, from railways to the automotive and avionics scenarios. At the same time, both technology and architectures are today at a turning point.

In year 2015 the workshop will provide an open forum for presentations and will challenge the participants to think and discuss hot research topics. Prospective authors are encouraged to submit their work regarding the following topics (but not limited to):
• How to address test, fault tolerance and lifetime extension in heterogeneous low-power multicore systems?
• How to tackle cross-layer optimizations for design, test and reliability of multicore systems at nanoscale?
• How to test and verify reliable embedded systems without time and effort explosions?

A wider scope of topics relevant to the workshop includes the following:
• Methodologies/techniques for manufacturing reliable nanoscale devices
• System level design, on-line testing/fault tolerance
• Dependability Evaluation and Validation/Debug Methodologies
• Fault tolerance for space applications
• Fault tolerance for transportation systems
• Fault tolerance for medical devices

General Co-Chairs
Lorena Anghel, TIMA, Grenoble, FR
Olivier Héron, CEA LIST, FR

Program Co-Chairs
Maksim Jenihhin, Tallinn UT, EE
Elena Gramatová, Slovak UT, SK