The theme for ATS 2011 will be "Test Odyssey 2020: Testing Systems and Devices at the Peta and Nano Scales". This theme is inspired by the fact that technology is trending towards extremely high levels of integration at the package and chip levels, very high speeds of operation () 100 GHz) and use of deeply scaled technology (approaching 10nm CMOS). In addition, a key test challenge will arise due to the ability to design complex systems such as robots that encompass sensors, communications systems, processors, transducers and enabling software. In addition to passing post-manufacture test procedures, such systems and relevant devices must exhibit fault-tolerance and survivability characteristics. Original contributions in testing, fault tolerant and reliable computing are solicited.