The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic
circuits and systems. Major topics include, but are not limited to:

• Analog, Mixed-Signal & RF Test
• ATPG & Compression
• ATE Architecture & Software
• Built-In Self-Test (BIST)
• Defect & Current Based Test
• Defect/Fault Tolerance
• Delay & Performance Test
• Design for Testability (DFT)
• Design Verification/Validation
• Diagnosis and Debug
• Embedded System & Board Test
• Embedded Test Methods
• Emerging Technologies Test
• FPGA Test
• Fault Modeling and Simulation
• Hardware Security
• Low-Power IC Test
• Microsystems, MEMS and Sensor Test
• Memory Test and Repair
• On-Line Test & Error Correction
• Power and Thermal Issues in Test
• System-on-Chip (SOC) Test
• Test Standards
• Test Economics
• Test of Biomedical Devices
• Test of High-Speed I/O
• Test Quality and Reliability
• Test Resource Partitioning
• Transients and Soft Errors
• 2.5D, 3D and SiP Test