The CPS (Cyber-Physical Systems) research community has created a large number of formal analysis methods that verify different properties of CPS. Unfortunately, while the analyses are proven to be correct by themselves, their combination and verification of assumptions are mostly left to the user. However, safety critical CPS used in practice require certification that can use all of these analyses if only its integration could be as formal as the analyses themselves. In this workshop we focus on the formal integration of analysis into sound arguments able to automate the discharging of certification claims.

This workshop is not only concerned about the creation and processing of formal arguments to integrate analyses from multiple domains but also the consumption of the arguments by certification authorities.

Co-located with CPS IoT Week. Saint Malo, France


Topics of Interest Include but not limited to:
- Composition and integration of multiple formal arguments
- Integration of formal arguments from different analysis domains
- Automated verification and validation of certification claims
- Arguments modularization
- Incremental development of certification arguments
- Reuse of certification arguments
- Formal treatment of uncertainty in certification arguments
- Automated generation of certification artifacts
- Validation of argument assumptions
- Traceability between models and requirements
- Runtime behavioral constraints to meet constraints
- Runtime behavioral isolation for modularization and cross-domain constraints
- Model-Based verification and validation arguments
- GenAI to support formal arguments
- Argumentation for AI assurance
- Security arguments

Types of Submission
- Position Papers: submitted to the committee as extended abstracts that present positions on challenges and research directions. The extended abstract should be formatted in a double column ACM conference format with at most 2 pages in length.
- Regular Innovation Papers: reporting innovations in the field. This should be formatted in double column ACM conference format with at most 6 pages.