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AiTest 2025 : 7th IEEE International Conference on Artificial Intelligence Testing

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Link: https://conf.researchr.org/track/cisose-2025/ai-test2025
 
When Jul 21, 2025 - Jul 24, 2025
Where Tucson, Arizona, USA
Submission Deadline Apr 1, 2025
Notification Due May 10, 2025
Final Version Due Jun 1, 2025
 

Call For Papers

IEEE AITest 2025 is the seventh edition of the IEEE series conference, focusing on the synergy of artificial intelligence (AI) and software testing. This conference provides an international forum for researchers and practitioners to exchange novel research results, articulate the problems and challenges from practices, deepen our understanding of the subject area with new theories, methodologies, techniques, process models, impacts, etc., and improve the practices with new tools and resources. This year’s conference is scheduled in Tucson, Arizona, USA, from 21-24 July 2025. The conference is part of the IEEE CISOSE 2025 congress.
Topics of Interest

Methodologies, theories, techniques, and tools for testing, verification, and validation of AI
Test Oracle for testing AI
Tools and resources for automated testing of AI
Specific concerns of testing with domain specific AI
AI techniques to software testing
AI applications to software testing
Testing of Large Language Models (LLMs)
Data quality and validation for AI
Human testers and AI-based testing
Quality assurance for unstructured training data
Quality evaluation and assurance for LLMs
LLMs for software engineering and testing
Responsible AI testing
Techniques for testing deep neural network learning, reinforcement learning, and graph learning
Constraint programming for test case generation and test suite reduction
Constraint scheduling and optimization for test case prioritization and test execution scheduling
Crowdsourcing and swarm intelligence in software testing
Genetic algorithms, search-based techniques, and heuristics to optimize testing
Large-scale unstructured data quality certification
AI and data management policies
Impact of GAI on education
Computer Vision Testing
Intelligent Chatbot Testing
Smart Machine (Robot/AV/UAV) Testing
Fairness, ethics, bias, and trustworthiness for LLM applications

Important Dates
Main paper

April 1st, 2025 Submission deadline
May 10th, 2025 Author’s notification
June 1st, 2025 Camera-ready and author’s registration

Workshop paper

May 15th, 2025 Submission deadline
May 22nd, 2025 Author’s notification
June 1st, 2025 Camera-ready and author’s registration

Submission

Submit original manuscripts (not published or submitted elsewhere) with the following page limits: regular papers (8 pages), short papers (4 pages), AI testing in practice (8 pages), and tool demo track (6 pages). We welcome submissions of both regular research papers that describe original and significant work or reports on case studies and empirical research and short papers that describe late-breaking research results or work in progress with timely and innovative ideas. All types of papers can have 2 extra pages subject to page charges. The AI Testing in Practice Track provides a forum for networking, exchanging ideas and innovative or experimental practices to address SE research that directly impacts the practice of software testing for AI. The tool track provides a forum to present and demonstrate innovative tools and/or new benchmarking datasets in the context of software testing for AI. All papers must be written in English. Papers must include a title, an abstract, and a list of 4-6 keywords. All papers must be prepared in the IEEE double-column proceedings format. Authors submit their papers via the link by April 1, 2025, 23:59 AoE. For more information, please visit the conference website. The use of content generated by AI in an article (including but not limited to text, figures, images, and code) shall be disclosed in the acknowledgements section of the submitted article.
Conference Proceedings & Special Section of SCI journals.

https://easychair.org/conferences2/submissions?a=33809361

All accepted papers will be published by IEEE Computer Society Press (EI-Index) and included in the IEEE Digital Library. The best papers will be invited to submit an extended version (with at least 30% novel content) to the selected special issues (TBA).

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