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NEW: Submission deadline extended to January 7, 2011
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Co-located with ICST 2011
(4th International Conference on Software Testing, Verification
and Validation)

March 21, 2011, Berlin, Germany

http://amost2011.lcis.grenoble-inp.fr

The increasing use of software and the growing system complexity, in
size, heterogeneity, autonomy, physical distribution, and dynamicity
make focused software system testing a challenging task. Recent years
have seen an increasing industrial and academic interest in the use of
models for designing and testing software. Success has been reported
using a range of types of models using a variety of specification
formats, notations and formal languages, such as UML, SDL, B and Z.

The goal of the A-MOST workshop is to bring together researchers and
practitioners to discuss the current state of the art and practice as
well as future prospects for Model-Based software Testing (MBT).

Topics of Interest include (but are not limited to):
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Models:
- Models for component, integration and system testing
- Product-line models
- (Hybrid) embedded system models
- Systems-of-systems models
- Architectural models
- Models for orchestration and choreography of services
- Executable models and simulation
- Environment and use models
- Non-functional models
- Models of SUT, properties and environments

Processes, Methods and Tools:
- Model-based test generation algorithms
- Application of model checking techniques in model-based testing
- Tracing from requirements model to test models
- Performance and predictability of model-driven development
- Test model evolution during the software lifecycle
- Risk-based approaches for MBT
- Generation of testing-infrastructures from models
- Combinatorial approaches for MBT
- Statistical testing

Experiences and Evaluation:
- Non-functional/Quantitative MBT
- Estimating dependability (e.g., security, safety, reliability)
using MBT
- Coverage metrics and measurements for structural and
(non-)functional models
- Cost of testing, economic impact of MBT
- Empirical validation, experiences, case studies using MBT


Submissions:
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We invite submissions of full-length (8 pages) papers that describe
new research, tools, technologies, and industry experience.
Short (4 pages) position papers or experience reports are also welcome.
Papers *must* be submitted in PDF format and *must* not exceed
eight pages (including all text, figures, references and appendices).
Each submitted paper must conform to the IEEE Format
and Submission Guidelines and use the IEEE Journal style.
Check http://amost2011.lcis.grenoble-inp.fr for more details.

Proceedings:
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Workshop Proceedings will be published in the IEEE Digital Library.

Important Dates:
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Submission Deadline: January 7, 2011 !NEW!
Notification: February 1, 2011
Camera-Ready: March 11, 2011
Workshop: March 21, 2011


Organization:
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Christof Budnik, Siemens Corporate Research, USA
Ioannis Parissis, Grenoble INP-LCIS, France

Programme Committee:
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Paul Ammann, George Mason University, USA
Mikhail Auguston, NPS, USA
Bob Binder, mVerify Corporation, USA
Christof Budnik, Siemens Corporate Research, USA
Steve Counsell, Brunel University, UK
Robert Eschbach, Fraunhofer IESE, Germany
Gordon Fraser, Saarland University, Germany
Lars Frantzen, Radboud University Nijmegen, Netherlands
Angelo Gargantini, University of Bargamo, Italy
Wolfgang Grieskamp, Microsoft Research, USA
Rob Hierons, Brunel University, UK
Lan Lin, University of Tennessee, USA
Mercedes MerayoUniversidad Complutense de Madrid, Spain
Brian Nielsen, Aalborg University, Denmark
Manuel Nunez, Universidad Complutense de Madrid, Spain
Jeff Offut, George Mason University, USA
Ioannis Parissis, University of Grenoble, France
Alexandre Petrenko, CRIM, Canada
Jesse Poore, University of Tennessee, USA
Alexander Pretschner, Karlsruhe Institute of Technology, Germany
Carsten Weise, RWTH Aachen University, Germany
Franz Wotawa, Technische Universitaet Graz, Austria


Steering Committee:
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Rob Hierons, Brunel University, UK (rob.hierons@brunel.ac.uk)
Manuel Nunez, Universidad Complutense de Madrid, Spain (mn@sip.ucm.es)
Jesse Poore, University of Tennessee, (poore@eecs.utk.edu)
Alexander Pretschner, Fraunhofer IESE, Germany (alexander.pretschner@iese.fraunhofer.de)