2011 International Conference on Manufacturing and Industrial Engineering (ICMIE 2011) is the premier forum for the presentation of new advances and research results in the fields of theoretical, experimental, and applied Manufacturing and Industrial Engineering. The conference will bring together leading researchers, engineers and scientists in the domain of interest from around the world. Topics of interest for submission include, but are not limited to:

Manufacturing Engineering
Manufacturing system and simulation
Manufacturing processes and technology
CAM, CIM, FMS
FEM in manufacturing
Cellular manufacturing
Lean and Agile Manufacturing
Nano Fabrication and Precision Engineering
Mechatronics
Computer Aided Metrology
Material Science
Advances in Composites
Nanomaterials
Surface Modification Technologies
Materials Characterization
Automation
Industrial Automation and Process Control
Intelligent Controllers
Virtual Instrumentation in Automation
Machine Vision system
Industrial Robots and Automation
Programmable Logic Controllers & Distributed Control System
Embedded System
SCADA
Sensors for Automation
Vibration Engineering

Industrial Engineering
Decision Analysis and Methods
E-Business and E-Commerce
Engineering Economy and Cost Analysis
Engineering Education and Training
Facilities Planning and Management
Global Manufacturing and Management
Human Factors
Information Processing and Engineering
Intelligent Systems
Manufacturing Systems
Operations Research
Production Planning and Control
Project Management
Quality Control and Management
Reliability and Maintenance Engineering
Safety, Security and Risk Management
Service Innovation and Management
Supply Chain Management
Systems Modeling and Simulation
Technology and Knowledge Management
Industrial Engineering and Operations Management
Performance modeling and Optimization of Manufacturing system
Concurrent Engineering
Logistics and Supply Chain Management
Safety, Quality and Reliability

The ICMIE 2011 conference proceeding will be published by IEEE, which will be included in the IEEE Xplore, and indexed by the Ei Compendex and other indexing services.