Major topics include, but are not limited to:

# Analog, Mixed-Signal & RF Test
# ATPG & Compression
# ATE Architecture & Software
# Board & System Test
# Built-In Self-Test (BIST)
# Current Based Test
# Defect/Fault Tolerance & Self-Repair
# Delay & Performance Test
# Design for Testability (DFT)
# Design Verification/Validation
# Diagnosis and Debug
# Embedded System and Microsystems Test
# Embedded Test Methods
# Emerging Technologies Test
# FPGA Test
# Fault Modeling and Simulation
# Infrastructure IP
# Low-Power IC Test
# MEMS And Sensor Test
# Memory Test and Repair
# On-Line Test
# Power Issues in Test
# System-on-Chip (SOC) Test
# System-in-Package Test
# Standards
# Test Economics
# Thermal Test
# Test of Biomedical Devices
# Test of High-Speed I/O
# Test Quality and Reliability
# Test Resource Partitioning
# Transients & Soft Errors