For over 20 years, the IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) has filled a critical need in our industry by providing a venue for industry professionals to network, learn and share knowledge on new and best-method manufacturing practices and concepts.
The conference synergy leads to understandings and relationships which can benefit participating companies in a variety of ways, including accelerating innovation, promoting successes, and getting a more thorough understanding of standards and benchmarks

Technical Sessions
Advanced Metrology
Advanced Process Control
Advanced Processes and Materials
Contamination Free Manufacturing
Defect Inspection I & II
Design for Manufacturing and Lithography
Fab Optimization
Interactive Poster Session
Reducing Cost and Maximizing Equipment Productivity
Yield Enhancement/Methodologies I & II

Who Should Attend
Technical managers, engineers, plant managers and other semiconductor professionals involved:
Production Control
Process Development
Fab Operations
Device Characterization
Cycle Time Improvement
Cost Reduction
Fab Productivity
Preventative Maintenance
Line Supervision
Product Management
Yield Enhancement

ASMC 2011 Best Paper Award
All papers presented at ASMC will be considered for the ASMC 2011 Entegris Best Paper Award, which will be announced following the conference and awarded at ASMC 2012.

ASMC 2011 Outstanding Student Paper
Papers authored by an individual student or student/professor will receive special consideration for the 2011 ASMC Outstanding Student Paper competition, sponsored by ISMI. Students wishing to be considered for this award should so note in their abstract submission. The award will be announced following ASMC 2011 and presented at ASMC 2012.