ASTR 2011 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

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ASTR 2011 : IEEE/CPMT TC-7 Workshop on Accelerated Stress Testing & Reliability

Link: http://www.ewh.ieee.org/soc/cpmt/tc7/ast2011/

When	Oct 12, 2011 - Oct 14, 2011
Where	San Francisco, USA
Submission Deadline	Mar 15, 2011
Notification Due	Apr 15, 2011
Final Version Due	May 20, 2011

Categories stress testing reliability

Call For Papers

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