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ESEM 2010 : 4th International Symposium on Empirical Software Engineering and MeasurementConference Series : Empirical Software Engineering and Measurement | |||||||||||||
Link: http://esem2010.case.unibz.it/index.html | |||||||||||||
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Call For Papers | |||||||||||||
Initial call copied off web site on 2009/11/05
call for papers The objective of the IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) is to provide a forum where researchers and practitioners can report and discuss recent research results in the areas of empirical software engineering and software measurement. The symposium encourages the exchange of ideas that help communicate the strengths and weaknesses of software engineering's technologies and methods from an empirical viewpoint. It focuses on the processes, design and structure of empirical studies, and the results of specific studies. These studies may vary from controlled experiments to field studies and from quantitative to qualitative studies. The symposium also provides a forum for exploring the use of data and measurement to understand, evaluate, and model software engineering phenomena. The symposium equally encourages new novel ideas and replication studies. The relevant topics include, but are not restricted to, the following: * Empirical studies of software processes and products * Evaluation and comparison of techniques and models * Reports on the benefits derived from using certain technologies * Empirically-based decision making * Development of predictive models * Measurement theory and fundamental issues * Qualitative methods * Families of experiments * Replication of empirical studies * Industrial experience in process improvement * Quality measurement and assurance * Experience management * Systematic reviews * Evidence-based software engineering * Infrastructures and novel techniques for conducting empirical/experimental studies * Mining data from software repositories * Measurement education and empirical studies with students * Effort and cost estimation, defect rate and reliability prediction short papers poster sessions full paper submissions Every accepted full paper must have a full registration. |
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