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Present CFP : 2020
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, reliability and security of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2020. Proposals for the innovative practices and special sessions tracks are also invited.
Major topics include but are not limited to:
* Analog/Mixed-Signal/RF Test
* ATPG & Compression
* Silicon Debug
* Automotive Test & Safety
* Built-In Self-Test (BIST)
* Defect & Current Based Test
* Defect/Fault Tolerance
* Delay & Performance Test
* Design for Testability (DFT)
* Design Verification/Validation
* Embedded System & Board Test
* Embedded Test Methods
* Emerging Technologies
* Test FPGA
* Test Fault Modeling and Simulation
* Hardware Security
* Low-Power IC Test
* Microsystems/MEMS/Sensors Test
* Memory Test and Repair
* On-Line Test & Error Correction
* Power/Thermal Issues in Test
* System-on-Chip (SOC) Test
* Test Standards & Economics
* Test of Biomedical Devices
* Test of High-Speed I/O
* Test Quality and Reliability
* Test Resource Partitioning
* Transients and Soft Errors
* 2.5D, 3D and SiP Test
* Yield Optimization
New hot topics:
VTS puts particular emphasis on enlarging its scope soliciting submissions on aspects on the following hot topics: Testing AI and Neuromorphic Devices, Machine Learning for Test, Test/Reliability/Security in Approximate and Quantum Computing.
* Regular paper registration (title, abstract and authors): October 4th, 2019
* Regular paper PDF upload: October 11th, 2019
* Special sessions and IP tracks submission: October 11th, 2019
* Notification of acceptance: December 10th, 2019
* Camera ready deadline: February 7, 2020
The VTS Program Committee invites original, unpublished Paper Submissions for VTS 2020. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.
Proposals for the Innovative Practices and Special Sessions tracks are also invited. The innovative practices track highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include invited presentations on hot topics, panels, embedded tutorials. Innovative practices and special session track proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.
All submissions are to be made electronically through the VTS website. A submission will be considered as evidence that, upon acceptance, the author(s) will submit a final camera-ready version of the paper. Registration of at least one author by the camera-ready deadline and presentation of the paper at the symposium are also required for inclusion of the paper in the published proceedings.
VTS 2020 will present a Best Paper Award, a Best Special Session Award, and a Best Innovative Practices Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges. We also plan to organize various Student Activities including the TTTC Best Doctoral Thesis Contest and PhD Poster Forum, details for which will be made available through the VTS website.
For general information:
Lorena Anghel (TIMA) - e-mail: email@example.com
Amit Majumdar (Xilinx) - e-mail: firstname.lastname@example.org
For submission-related information:
Stefano Di Carlo (Politecnico di Torino) - e-mail: email@example.com
Peilin Song (IBM Research) - e-mail: firstname.lastname@example.org
The 38th IEEE VLSI Test Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).